Charged defects in graphene and the ionicity of hexagonal boron nitride in direct images

We report on the detection and charge distribution analysis for nitrogen substitutional dopants in single layer graphene membranes by aberration-corrected high-resolution transmission electron microscopy (HRTEM). Further, we show that the ionicity of single-layer hexagonal boron nitride can be confi...

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Published inarXiv.org
Main Authors Meyer, Jannik C, Kurasch, Simon, Hye Jin Park, Skakalova, Viera, Künzel, Daniela, Groß, Axel, Chuvilin, Andrey, Algara-Siller, Gerardo, Roth, Siegmar, Iwasaki, Takayuki, Starke, Ulrich, Smet, Jürgen, Kaiser, Ute
Format Paper
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 04.06.2010
Subjects
Boron nitride
Charge distribution
Chemical bonds
Electronic structure
Electrons
First principles
Graphene
Image detection
Organic chemistry
Point defects
Transmission electron microscopy
X-ray diffraction
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Summary:We report on the detection and charge distribution analysis for nitrogen substitutional dopants in single layer graphene membranes by aberration-corrected high-resolution transmission electron microscopy (HRTEM). Further, we show that the ionicity of single-layer hexagonal boron nitride can be confirmed from direct images. For the first time, we demonstrate by a combination of HRTEM experiments and first-principles electronic structure calculations that adjustments to the atomic potentials due to chemical bonding can be discerned in HRTEM images. Our experiments open a way to discern electronic configurations in point defects or other non-periodic arrangements or nanoscale objects that can not be analyzed in an electron or x-ray diffraction experiment.
ISSN:2331-8422