Design of a general scientific CCD simulation and test system

In this paper, we introduce a general scientific CCD simulation and test system which can meet the test requirements of different types of CCD chips from E2V company, such as measuring different signals output from modules of a CCD controller including power supply, fan, temperature control module,...

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Bibliographic Details
Published inarXiv.org
Main Authors Zhang, Yi, Hong-fei, Zhang, Wang, Jian-min, Feng, Yi, Chen, Cheng, Zi-ang, Wang, Qi-jie Tang, Zhang, Guang-yu, Wang, Jian
Format Paper
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 05.03.2019
Subjects
Control systems design
Controllers
Crystal oscillators
Modules
Power supplies
Random noise
Simulation
Temperature control
Test systems
Video signals
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Summary:In this paper, we introduce a general scientific CCD simulation and test system which can meet the test requirements of different types of CCD chips from E2V company, such as measuring different signals output from modules of a CCD controller including power supply, fan, temperature control module, crystal oscillator, shutter and clock-bias generator. Furthermore, the video signal of the CCD detector can be simulated and superimposed with random noise to verify the performance of the video sampling circuit of the CCD controller. The simulation and test system was successful used for the CCD controller which was designed for E2V CCD47-20 detector.
ISSN:2331-8422