Optical study of Tm-doped solid solution (Sc^sub 0.5^Y^sub 0.5^)^sub 2^SiO^sub 5^ crystal

Tm-doped (Sc0.5Y0.5)2SiO5 (SYSO) crystals were grown by Czochralski method. The UV-VIR-NIR absorption spectra and the near-infrared emission spectra were measured and analysed by the Judd-Ofelt approach. Temperature influence on both absorption and emission spectra has been determined from the data...

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Published inJournal of crystal growth Vol. 487; p. 83
Main Authors Shi, Jiaojiao, Liu, Bin, Zheng, Lihe, Wang, Qingguo, Tang, Huili, Liu, Junfang, Su, Liangbi, Wu, Feng, Zhao, Hengyu, He, Nuotian, Li, Na, Li, Qiu, Guo, Chao, Xu, Jun, Yang, Kejian, Xu, Xiaodong, Ryba-Romanowski, Witold, Lisiecki, Radoslaw, Solarz, Piotr
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier BV 01.04.2018
Subjects
Absorption spectra
Czochralski method
Emission analysis
Emission spectra
Infrared analysis
Infrared spectra
Near infrared radiation
Optical properties
Single crystals
Solid solutions
Solid state physics
Thulium
Trace elements
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Summary:Tm-doped (Sc0.5Y0.5)2SiO5 (SYSO) crystals were grown by Czochralski method. The UV-VIR-NIR absorption spectra and the near-infrared emission spectra were measured and analysed by the Judd-Ofelt approach. Temperature influence on both absorption and emission spectra has been determined from the data recorded at room temperature and 10 K. It has been found that the structural disorder resulting from dissimilar ionic radii of Sc3+ and Y3+ in the solid solution (Sc0.5Y0.5)2SiO5 crystal brings about a strong inhomogeneous broadening of Tm3+ ions spectra. However, it affects the excited state relaxation dynamics inherent to thulium-doped Y2SiO5 and Sc2SiO5 hosts weakly.
ISSN:0022-0248
1873-5002