Enantiomorph identification and stacking faults in [kappa]-(BEDT-TTF)2Cu(NCS)2 by convergent-beam electron diffraction
The convergent-beam electron diffraction (CBED) method proposed recently for enantiomorph identification has been successfully applied to an ambient-pressure superconductor κ-(BEDT-TTF)2Cu(NCS)2 [BEDT-TTF is bis(ethylenedithio)tetrathiafulvalene]. Enantiomorph identification (either the left-handed...
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Published in | Journal of applied crystallography Vol. 42; no. 3; p. 433 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Oxford
Blackwell Publishing Ltd
01.06.2009
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Subjects | |
Online Access | Get full text |
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Summary: | The convergent-beam electron diffraction (CBED) method proposed recently for enantiomorph identification has been successfully applied to an ambient-pressure superconductor κ-(BEDT-TTF)2Cu(NCS)2 [BEDT-TTF is bis(ethylenedithio)tetrathiafulvalene]. Enantiomorph identification (either the left-handed or right-handed form within the space group P21) of each crystal grown of κ-(BEDT-TTF)2Cu(NCS)2 was achieved at ambient temperature without the need to cool the specimens. Enantiomorph identification was possible within the framework of the proposed method only by taking an additional selected-area electron diffraction pattern to eliminate the ambiguity of 180° rotation of the relevant CBED pattern about the incident beam. In the present study, all four specimens investigated exhibit the right-handed form. [PUBLICATION ABSTRACT] |
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ISSN: | 0021-8898 1600-5767 |
DOI: | 10.1107/S0021889809015702 |