Enantiomorph identification and stacking faults in [kappa]-(BEDT-TTF)2Cu(NCS)2 by convergent-beam electron diffraction

The convergent-beam electron diffraction (CBED) method proposed recently for enantiomorph identification has been successfully applied to an ambient-pressure superconductor κ-(BEDT-TTF)2Cu(NCS)2 [BEDT-TTF is bis(ethylenedithio)tetrathiafulvalene]. Enantiomorph identification (either the left-handed...

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Bibliographic Details
Published inJournal of applied crystallography Vol. 42; no. 3; p. 433
Main Authors Fujio, Satoshi, Tanaka, Katsushi, Inui, Haruyuki, Ueji, Rintaro, Sumida, Naoto, Yamochi, Hideki, Saito, Gunzi
Format Journal Article
LanguageEnglish
Published Oxford Blackwell Publishing Ltd 01.06.2009
Subjects
Chemical compounds
Crystal structure
Crystallography
Diffraction
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Summary:The convergent-beam electron diffraction (CBED) method proposed recently for enantiomorph identification has been successfully applied to an ambient-pressure superconductor κ-(BEDT-TTF)2Cu(NCS)2 [BEDT-TTF is bis(ethylenedithio)tetrathiafulvalene]. Enantiomorph identification (either the left-handed or right-handed form within the space group P21) of each crystal grown of κ-(BEDT-TTF)2Cu(NCS)2 was achieved at ambient temperature without the need to cool the specimens. Enantiomorph identification was possible within the framework of the proposed method only by taking an additional selected-area electron diffraction pattern to eliminate the ambiguity of 180° rotation of the relevant CBED pattern about the incident beam. In the present study, all four specimens investigated exhibit the right-handed form. [PUBLICATION ABSTRACT]
ISSN:0021-8898
1600-5767
DOI:10.1107/S0021889809015702