Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of[...]-TiAl with High Accuracy Band Detection

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 21; p. 2037
Main Authors Sitzman, Scott, Schmidt, Niels-Henrik, Palomares-Garcia, Alberto, Munoz-Moreno, Rocio, Goulden, Jenny
Format Journal Article
LanguageEnglish
Published Oxford Oxford University Press 01.08.2015
Subjects
Accuracy
Data collection
Microscopy
Symmetry
United Kingdom > UK
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ISSN:1431-9276
1435-8115
DOI:10.1017/S143192761501096X