Effects of Contact Roughness and Trapped Free Space on Characteristics of RF-MEMS Capacitive Shunt Switches/Effets du contact de la rugosité et de l'espace libre piégé sur les caractéristiques des switches shunt capacitifs MEMS-RF

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Bibliographic Details
Published inCanadian journal of electrical and computer engineering Vol. 39; no. 2; p. 132
Main Authors Nejad, Ali Ghaffari, Hasani, Javad Yavand
Format Journal Article
LanguageEnglish
Published Montreal The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 01.04.2016
Subjects
Computer engineering
Electrical engineering
Microelectromechanical systems
Radio frequency
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ISSN:0840-8688