Electrical studies on Zr-modified Bi^sub 3.25^La^sub 0.75^Ti^sub 3^O^sub 12^: a promising FRAM ceramic
Zr-modified Auruvillius family of lanthanum bismuth titanate, namely Bi...La...Ti...Zr...O... (BLTZ, x = 0, 0.1, 0.3, 0.5, 0.7 and 1), was prepared by solid-state reaction method. Dielectric properties of the ceramics were studied as a function of temperature. Hysteresis measurements were also perfo...
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Published in | Phase transitions Vol. 87; no. 12; p. 1246 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Abingdon
Taylor & Francis Ltd
01.12.2014
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Subjects | |
Online Access | Get full text |
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Summary: | Zr-modified Auruvillius family of lanthanum bismuth titanate, namely Bi...La...Ti...Zr...O... (BLTZ, x = 0, 0.1, 0.3, 0.5, 0.7 and 1), was prepared by solid-state reaction method. Dielectric properties of the ceramics were studied as a function of temperature. Hysteresis measurements were also performed. Among the composition, Bi...La...Ti...Zr...O... (BLTZ1) showed large remnant polarization compared to the promising ceramic, namely Bi...La...Ti...O... The results were corroborated with the pyroelectric, electric polarization and Raman spectroscopic data. (ProQuest: ... denotes formulae/symbols omitted.) |
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ISSN: | 0141-1594 1029-0338 |