Electrical studies on Zr-modified Bi^sub 3.25^La^sub 0.75^Ti^sub 3^O^sub 12^: a promising FRAM ceramic

Zr-modified Auruvillius family of lanthanum bismuth titanate, namely Bi...La...Ti...Zr...O... (BLTZ, x = 0, 0.1, 0.3, 0.5, 0.7 and 1), was prepared by solid-state reaction method. Dielectric properties of the ceramics were studied as a function of temperature. Hysteresis measurements were also perfo...

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Bibliographic Details
Published inPhase transitions Vol. 87; no. 12; p. 1246
Main Authors Reddy, N Thirumal, Prasad, NV, Kumar, GS, Prasad, G
Format Journal Article
LanguageEnglish
Published Abingdon Taylor & Francis Ltd 01.12.2014
Subjects
Ceramics
Chemical reactions
Dielectric properties
Electromagnetics
Solid state physics
Spectrum analysis
Temperature effects
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Summary:Zr-modified Auruvillius family of lanthanum bismuth titanate, namely Bi...La...Ti...Zr...O... (BLTZ, x = 0, 0.1, 0.3, 0.5, 0.7 and 1), was prepared by solid-state reaction method. Dielectric properties of the ceramics were studied as a function of temperature. Hysteresis measurements were also performed. Among the composition, Bi...La...Ti...Zr...O... (BLTZ1) showed large remnant polarization compared to the promising ceramic, namely Bi...La...Ti...O... The results were corroborated with the pyroelectric, electric polarization and Raman spectroscopic data. (ProQuest: ... denotes formulae/symbols omitted.)
ISSN:0141-1594
1029-0338