I^sub DDQ^-based diagnosis at very low voltage (VLV) for bridging defects

• Published in: Electronics letters Vol. 43; no. 5; p. 1
• Main Authors: Arumi, D, Rodríguez-Montañés, R, Figueras, J, Eichenberger, S, Hora, C, Kruseman, B, Lousberg, M
• Format: Journal Article
• Language: English
• Published: Stevenage John Wiley & Sons, Inc 01.03.2007

Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply values, thus facilitating the diagnosi...