I^sub DDQ^-based diagnosis at very low voltage (VLV) for bridging defects

Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply values, thus facilitating the diagnosi...

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Bibliographic Details
Published inElectronics letters Vol. 43; no. 5; p. 1
Main Authors Arumi, D, Rodríguez-Montañés, R, Figueras, J, Eichenberger, S, Hora, C, Kruseman, B, Lousberg, M
Format Journal Article
LanguageEnglish
Published Stevenage John Wiley & Sons, Inc 01.03.2007
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Summary:Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply values, thus facilitating the diagnosis of such defects. The experimental evidence of this behaviour is presented.
ISSN:0013-5194
1350-911X