I^sub DDQ^-based diagnosis at very low voltage (VLV) for bridging defects
Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply values, thus facilitating the diagnosi...
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| Published in | Electronics letters Vol. 43; no. 5; p. 1 |
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| Main Authors | , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Stevenage
John Wiley & Sons, Inc
01.03.2007
|
| Online Access | Get full text |
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| Abstract | Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply values, thus facilitating the diagnosis of such defects. The experimental evidence of this behaviour is presented. |
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| AbstractList | Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply values, thus facilitating the diagnosis of such defects. The experimental evidence of this behaviour is presented. |
| Author | Figueras, J Hora, C Kruseman, B Rodríguez-Montañés, R Eichenberger, S Arumi, D Lousberg, M |
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| Copyright | Copyright The Institution of Engineering & Technology Mar 1, 2007 |
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| Snippet | Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of... |
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| Title | I^sub DDQ^-based diagnosis at very low voltage (VLV) for bridging defects |
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