Use of InSitu Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

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Bibliographic Details
Published in	Angewandte Chemie Vol. 125; no. 40; p. 10735
Main Authors	Thakuria, Ranjit, Eddleston, Mark D, Chow, Ernest H H, Lloyd, Gareth O, Aldous, Barry J, Krzyzaniak, Joseph F, Bond, Andrew D, Jones, William
Format	Journal Article
Language	German
Published	Weinheim Wiley Subscription Services, Inc 27.09.2013
Subjects	Chemistry
Online Access	Get full text

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ISSN:	0044-8249 1521-3757
DOI:	10.1002/ange.201302532