Influence of vacuum annealing on the properties of SILAR CuInS^sub 2^ thin films and optimization of annealing duration
The structural, compositional, morphological and optical properties of as-deposited and vacuum annealed CuInS^sub 2^ thin films prepared by successive ionic layer adsorption and reaction method are studied by X-ray diffractometer, energy dispersive X-ray analyzer, scanning electron microscope and sp...
Saved in:
| Published in | Journal of materials science. Materials in electronics Vol. 24; no. 9; p. 3481 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
New York
Springer Nature B.V
01.09.2013
|
| Online Access | Get full text |
Cover
Loading…
| Summary: | The structural, compositional, morphological and optical properties of as-deposited and vacuum annealed CuInS^sub 2^ thin films prepared by successive ionic layer adsorption and reaction method are studied by X-ray diffractometer, energy dispersive X-ray analyzer, scanning electron microscope and spectrophotometer respectively. The influence of vacuum annealing on the properties of CuInS^sub 2^ (CIS) thin films is discussed, annealing duration has also been optimized and reported in this paper.[PUBLICATION ABSTRACT] |
|---|---|
| ISSN: | 0957-4522 1573-482X |
| DOI: | 10.1007/s10854-013-1273-4 |