Modulated Structure of [eta]´-Cu3+x(Si,Ge) Determined by Quantitative Electron Diffraction Tomography

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7-August 11, 2011. [PUBLICATION ABSTRACT]

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 17; no. S2; p. 1106
Main Authors Palatinus, L, Klementová, M, Drínek, V, Jarosová, M, Petrícek, V
Format Journal Article
LanguageEnglish
Published Oxford Oxford University Press 01.07.2011
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7-August 11, 2011. [PUBLICATION ABSTRACT]
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927611006404