A 0.18-[micro]m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)
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Published in | IEEE journal of solid-state circuits Vol. 40; no. 1; p. 293 |
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Main Authors | , , , , , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
01.01.2005
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Online Access | Get full text |
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Author | Jeong, Gitae Oh, Hyung-Rok Jeong, Hongsik Cho, Woo Yeong Byun, Hyun-Geun Kwak, Choong-Keun Kim, Kinam Kim, Ki-Sung Ahn, S Cho, Beak-Hyung Kim, Du-Eung Choi, Byung-Gil Kang, Sangbeom Kim, Kyung-Hee Hwang, Youngnam Koh, Gwan-Hyeob |
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Author_xml | – sequence: 1 givenname: Woo surname: Cho middlename: Yeong fullname: Cho, Woo Yeong – sequence: 2 givenname: Beak-Hyung surname: Cho fullname: Cho, Beak-Hyung – sequence: 3 givenname: Byung-Gil surname: Choi fullname: Choi, Byung-Gil – sequence: 4 givenname: Hyung-Rok surname: Oh fullname: Oh, Hyung-Rok – sequence: 5 givenname: Sangbeom surname: Kang fullname: Kang, Sangbeom – sequence: 6 givenname: Ki-Sung surname: Kim fullname: Kim, Ki-Sung – sequence: 7 givenname: Kyung-Hee surname: Kim fullname: Kim, Kyung-Hee – sequence: 8 givenname: Du-Eung surname: Kim fullname: Kim, Du-Eung – sequence: 9 givenname: Choong-Keun surname: Kwak fullname: Kwak, Choong-Keun – sequence: 10 givenname: Hyun-Geun surname: Byun fullname: Byun, Hyun-Geun – sequence: 11 givenname: Youngnam surname: Hwang fullname: Hwang, Youngnam – sequence: 12 givenname: S surname: Ahn fullname: Ahn, S – sequence: 13 givenname: Gwan-Hyeob surname: Koh fullname: Koh, Gwan-Hyeob – sequence: 14 givenname: Gitae surname: Jeong fullname: Jeong, Gitae – sequence: 15 givenname: Hongsik surname: Jeong fullname: Jeong, Hongsik – sequence: 16 givenname: Kinam surname: Kim fullname: Kim, Kinam |
BookMark | eNqNTtFqAjEQXMRCz9ZvcKEv-pDrbi96uUcRSykIpUoplCLxTOnJJdHkFPr3zUM_oPsyM8wwswPoO-8MwIgpZ6bq_nm9XuQPRDJXRVmVciyZJpJ6kPF0qgSXxXsfMiJWokqxaxjEeEhSSsUZbOaYepT4sE0d_KfFIifxhjMpVjtMSxff6q5pDR6_dTSiC9rFpmu8w8T23qKuaxMjWmN9-MHxy-t8NbmFqy_dRjP8wxu4e1xuFk_iGPzpbGK3PfhzcMnacvprptJVxf9Sv3bzRyE |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005 |
DBID | 7SP 8FD L7M |
DOI | 10.1109/JSSC.2004.837974(410)40 |
DatabaseName | Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace |
DatabaseTitle | Technology Research Database Electronics & Communications Abstracts Advanced Technologies Database with Aerospace |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1558-173X |
ExternalDocumentID | 2679261891 |
GroupedDBID | -~X .DC 0R~ 29I 3EH 4.4 5GY 6IK 7SP 8FD 97E AAJGR ABQJQ ACGFS ACIWK ACNCT AENEX AETIX ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ IFIPE IPLJI JAVBF L7M LAI M43 O9- OCL P2P PZZ RIA RIE RIG RNS TAE TN5 |
ID | FETCH-proquest_journals_10186888893 |
ISSN | 0018-9200 |
IngestDate | Thu Oct 10 17:07:13 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Language | English |
LinkModel | OpenURL |
MergedId | FETCHMERGED-proquest_journals_10186888893 |
PQID | 1018688889 |
PQPubID | 85482 |
ParticipantIDs | proquest_journals_1018688889 |
PublicationCentury | 2000 |
PublicationDate | 20050101 |
PublicationDateYYYYMMDD | 2005-01-01 |
PublicationDate_xml | – month: 01 year: 2005 text: 20050101 day: 01 |
PublicationDecade | 2000 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE journal of solid-state circuits |
PublicationYear | 2005 |
Publisher | The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
SSID | ssj0014481 |
Score | 3.5846298 |
SourceID | proquest |
SourceType | Aggregation Database |
StartPage | 293 |
Title | A 0.18-[micro]m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM) |
URI | https://www.proquest.com/docview/1018688889 |
Volume | 40 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3battAEF1M8tI-lKYXeknDQhtIWNZVZEmWHm3XqQlxUhKldSnB6LIiplFcEvkh_dv-Sc-O1rLslNDWGFmsxHpWc5ibZmcYe-e29-zUslIZZZkvnSyNZKDTxNqZ7wbK9vDVm5OHR97gzDkYuaNG41cta2lWxM3k5x_3lfwPVzEGvupdsv_A2WpSDOAc_MURHMbxr3jcERBGvtx2u7nOq9t2P-Si1bTkZ-E5chgLuPaQPrj5UokfF9BXstCqibK0BM7SaS4i6pgocp1xS2_-P510hvP4gLFatUdYrzGBVU1SSXuRRDK5TmaTojLNexcUfP0ynYqvamr04mK8q6LvcnA7W7pAGQVdPSg_LlI-jiniQ_fKE-MKzOMT7kp8IqQc0FreQ5_a-1SlEPpVt5-bqgRjJR_JysYS56s2QhxPNigLnEKFGbntwhluU2vhSrCXdaCWAGykdNmU8a72oOKrB6enPQocNOG8w90CDc6eBRLMfEs1u4-Ox_tnh4fjsD8Kl6-SjWB77QA-qq_rK6zbkIVeucWwetEF77hs6mjWZFIQQcn7VTp2QMWuY90xGsgSCh-zR8aF4Z0Sjxusoa6esIe1wpZPWdjhhMxvhMvznBMqOaGS11DJV1HJS1TyEpW8RCXf0Zjcfcbe7vfD3kDOCRsbSN7oDELf8_EJWs_ZGv5AvWA8sTM7gZ2In9hRcRAHWeQoL2tB46lIOS_Z5n0zvbr_8mv2YIHDTbZWXM_UG1iORbxFz_43Bzxrhw |
link.rule.ids | 315,783,787,27936,27937 |
linkProvider | IEEE |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+0.18-%5Bmicro%5Dm+3.0-V+64-Mb+nonvolatile+phase-transition+random+access+memory+%28PRAM%29&rft.jtitle=IEEE+journal+of+solid-state+circuits&rft.au=Cho%2C+Woo+Yeong&rft.au=Cho%2C+Beak-Hyung&rft.au=Choi%2C+Byung-Gil&rft.au=Oh%2C+Hyung-Rok&rft.date=2005-01-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0018-9200&rft.eissn=1558-173X&rft.volume=40&rft.issue=1&rft.spage=293&rft_id=info:doi/10.1109%2FJSSC.2004.837974%28410%2940&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=2679261891 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9200&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9200&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9200&client=summon |