A 0.18-[micro]m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)

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Bibliographic Details
Published inIEEE journal of solid-state circuits Vol. 40; no. 1; p. 293
Main Authors Cho, Woo Yeong, Cho, Beak-Hyung, Choi, Byung-Gil, Oh, Hyung-Rok, Kang, Sangbeom, Kim, Ki-Sung, Kim, Kyung-Hee, Kim, Du-Eung, Kwak, Choong-Keun, Byun, Hyun-Geun, Hwang, Youngnam, Ahn, S, Koh, Gwan-Hyeob, Jeong, Gitae, Jeong, Hongsik, Kim, Kinam
Format Journal Article
LanguageEnglish
Published New York The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 01.01.2005
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Author Jeong, Gitae
Oh, Hyung-Rok
Jeong, Hongsik
Cho, Woo Yeong
Byun, Hyun-Geun
Kwak, Choong-Keun
Kim, Kinam
Kim, Ki-Sung
Ahn, S
Cho, Beak-Hyung
Kim, Du-Eung
Choi, Byung-Gil
Kang, Sangbeom
Kim, Kyung-Hee
Hwang, Youngnam
Koh, Gwan-Hyeob
Author_xml – sequence: 1
  givenname: Woo
  surname: Cho
  middlename: Yeong
  fullname: Cho, Woo Yeong
– sequence: 2
  givenname: Beak-Hyung
  surname: Cho
  fullname: Cho, Beak-Hyung
– sequence: 3
  givenname: Byung-Gil
  surname: Choi
  fullname: Choi, Byung-Gil
– sequence: 4
  givenname: Hyung-Rok
  surname: Oh
  fullname: Oh, Hyung-Rok
– sequence: 5
  givenname: Sangbeom
  surname: Kang
  fullname: Kang, Sangbeom
– sequence: 6
  givenname: Ki-Sung
  surname: Kim
  fullname: Kim, Ki-Sung
– sequence: 7
  givenname: Kyung-Hee
  surname: Kim
  fullname: Kim, Kyung-Hee
– sequence: 8
  givenname: Du-Eung
  surname: Kim
  fullname: Kim, Du-Eung
– sequence: 9
  givenname: Choong-Keun
  surname: Kwak
  fullname: Kwak, Choong-Keun
– sequence: 10
  givenname: Hyun-Geun
  surname: Byun
  fullname: Byun, Hyun-Geun
– sequence: 11
  givenname: Youngnam
  surname: Hwang
  fullname: Hwang, Youngnam
– sequence: 12
  givenname: S
  surname: Ahn
  fullname: Ahn, S
– sequence: 13
  givenname: Gwan-Hyeob
  surname: Koh
  fullname: Koh, Gwan-Hyeob
– sequence: 14
  givenname: Gitae
  surname: Jeong
  fullname: Jeong, Gitae
– sequence: 15
  givenname: Hongsik
  surname: Jeong
  fullname: Jeong, Hongsik
– sequence: 16
  givenname: Kinam
  surname: Kim
  fullname: Kim, Kinam
BookMark eNqNTtFqAjEQXMRCz9ZvcKEv-pDrbi96uUcRSykIpUoplCLxTOnJJdHkFPr3zUM_oPsyM8wwswPoO-8MwIgpZ6bq_nm9XuQPRDJXRVmVciyZJpJ6kPF0qgSXxXsfMiJWokqxaxjEeEhSSsUZbOaYepT4sE0d_KfFIifxhjMpVjtMSxff6q5pDR6_dTSiC9rFpmu8w8T23qKuaxMjWmN9-MHxy-t8NbmFqy_dRjP8wxu4e1xuFk_iGPzpbGK3PfhzcMnacvprptJVxf9Sv3bzRyE
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005
DBID 7SP
8FD
L7M
DOI 10.1109/JSSC.2004.837974(410)40
DatabaseName Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle Technology Research Database
Electronics & Communications Abstracts
Advanced Technologies Database with Aerospace
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1558-173X
ExternalDocumentID 2679261891
GroupedDBID -~X
.DC
0R~
29I
3EH
4.4
5GY
6IK
7SP
8FD
97E
AAJGR
ABQJQ
ACGFS
ACIWK
ACNCT
AENEX
AETIX
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
IFIPE
IPLJI
JAVBF
L7M
LAI
M43
O9-
OCL
P2P
PZZ
RIA
RIE
RIG
RNS
TAE
TN5
ID FETCH-proquest_journals_10186888893
ISSN 0018-9200
IngestDate Thu Oct 10 17:07:13 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 1
Language English
LinkModel OpenURL
MergedId FETCHMERGED-proquest_journals_10186888893
PQID 1018688889
PQPubID 85482
ParticipantIDs proquest_journals_1018688889
PublicationCentury 2000
PublicationDate 20050101
PublicationDateYYYYMMDD 2005-01-01
PublicationDate_xml – month: 01
  year: 2005
  text: 20050101
  day: 01
PublicationDecade 2000
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE journal of solid-state circuits
PublicationYear 2005
Publisher The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
SSID ssj0014481
Score 3.5846298
SourceID proquest
SourceType Aggregation Database
StartPage 293
Title A 0.18-[micro]m 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM)
URI https://www.proquest.com/docview/1018688889
Volume 40
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3battAEF1M8tI-lKYXeknDQhtIWNZVZEmWHm3XqQlxUhKldSnB6LIiplFcEvkh_dv-Sc-O1rLslNDWGFmsxHpWc5ibZmcYe-e29-zUslIZZZkvnSyNZKDTxNqZ7wbK9vDVm5OHR97gzDkYuaNG41cta2lWxM3k5x_3lfwPVzEGvupdsv_A2WpSDOAc_MURHMbxr3jcERBGvtx2u7nOq9t2P-Si1bTkZ-E5chgLuPaQPrj5UokfF9BXstCqibK0BM7SaS4i6pgocp1xS2_-P510hvP4gLFatUdYrzGBVU1SSXuRRDK5TmaTojLNexcUfP0ynYqvamr04mK8q6LvcnA7W7pAGQVdPSg_LlI-jiniQ_fKE-MKzOMT7kp8IqQc0FreQ5_a-1SlEPpVt5-bqgRjJR_JysYS56s2QhxPNigLnEKFGbntwhluU2vhSrCXdaCWAGykdNmU8a72oOKrB6enPQocNOG8w90CDc6eBRLMfEs1u4-Ox_tnh4fjsD8Kl6-SjWB77QA-qq_rK6zbkIVeucWwetEF77hs6mjWZFIQQcn7VTp2QMWuY90xGsgSCh-zR8aF4Z0Sjxusoa6esIe1wpZPWdjhhMxvhMvznBMqOaGS11DJV1HJS1TyEpW8RCXf0Zjcfcbe7vfD3kDOCRsbSN7oDELf8_EJWs_ZGv5AvWA8sTM7gZ2In9hRcRAHWeQoL2tB46lIOS_Z5n0zvbr_8mv2YIHDTbZWXM_UG1iORbxFz_43Bzxrhw
link.rule.ids 315,783,787,27936,27937
linkProvider IEEE
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+0.18-%5Bmicro%5Dm+3.0-V+64-Mb+nonvolatile+phase-transition+random+access+memory+%28PRAM%29&rft.jtitle=IEEE+journal+of+solid-state+circuits&rft.au=Cho%2C+Woo+Yeong&rft.au=Cho%2C+Beak-Hyung&rft.au=Choi%2C+Byung-Gil&rft.au=Oh%2C+Hyung-Rok&rft.date=2005-01-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0018-9200&rft.eissn=1558-173X&rft.volume=40&rft.issue=1&rft.spage=293&rft_id=info:doi/10.1109%2FJSSC.2004.837974%28410%2940&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=2679261891
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9200&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9200&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9200&client=summon