(2000). Controlling the structure and properties of high T thin-film devices. Characterization of High Tc Materials and Devices by Electron Microscopy.
Chicago Style (17th ed.) Citation"Controlling the Structure and Properties of High T Thin-film Devices." Characterization of High Tc Materials and Devices by Electron Microscopy 2000.
MLA (9th ed.) Citation"Controlling the Structure and Properties of High T Thin-film Devices." Characterization of High Tc Materials and Devices by Electron Microscopy, 2000.
Warning: These citations may not always be 100% accurate.