Controlling the structure and properties of high T thin-film devices

Saved in:
Bibliographic Details
Published inCharacterization of High Tc Materials and Devices by Electron Microscopy
Format Book Chapter
LanguageEnglish
Published United Kingdom Cambridge University Press 2000
Subjects
Condensed matter physics (liquids & solids)
Materials science
Online AccessGet full text
ISBN052155490X
9780521554909

Cover

More Information
ISBN:052155490X
9780521554909