Sequential model criticism in probabilistic expert systems : Probabilistic reasoning

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Bibliographic Details
Published inIEEE transactions on pattern analysis and machine intelligence Vol. 15; no. 3; pp. 209 - 219
Main Authors COWELL, R. G, DAWID, A. P, SPIEGELHALTER, D. J
Format Journal Article
LanguageEnglish
Published Los Alamitos, CA IEEE Computer Society 1993
Subjects
Applied sciences
Artificial intelligence
Computer science; control theory; systems
Exact sciences and technology
Learning and adaptive systems
Learning
Expert system
Probability
Probabilistic model
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ISSN:0162-8828
1939-3539