Electromigration activation energy in pure aluminum films deposited by partially ionized beam technique

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Bibliographic Details
Published inScripta metallurgica et materialia Vol. 33; no. 12; pp. 1981 - 1986
Main Authors KONONENKO, O. V, IVANOV, E. D, MATVEEV, V. N, KHODOS, I. I
Format Journal Article
LanguageRussian
Published Seoul Pergamon Press 1995
New York, NY
Oxford
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ISSN:0956-716X