A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution : Dependable Computing

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Bibliographic Details
Published inIEICE transactions on information and systems Vol. 96; no. 9; pp. 1994 - 2002
Main Authors YAMAZAKI, Hiroshi, WAKAZONO, Motohiro, HOSOKAWA, Toshinori, YOSHIMURA, Masayoshi
Format Journal Article
LanguageEnglish
Published Oxford Oxford University Press 2013
Subjects
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
VLSI circuit
don't care identification
test compaction
Compact design
Compaction
Electric utility
Field experiment
X-bit distribution
X-bit
Integrated circuit
Testing equipment
Custom circuit
Cost lowering
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ISSN:0916-8532
1745-1361