Stability of hydrogenated polymorphous silicon thin-film transistors under DC electrical stress : Thin-Film-Transistor Modeling for Circuit Simulation
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Published in | IET circuits, devices & systems Vol. 6; no. 2; pp. 113 - 117 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Stevenage
Institution of Engineering and Technology
2012
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Subjects | |
Online Access | Get full text |
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ISSN: | 1751-858X |
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