Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results : CHARACTERIZATION OF NANO CMOS VARIABIALITY BY SIMULATION AND MEASUREMENTS
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Published in | IEEE transactions on electron devices Vol. 58; no. 8; pp. 2227 - 2234 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York, NY
Institute of Electrical and Electronics Engineers
2011
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Subjects | |
Online Access | Get full text |
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ISSN: | 0018-9383 1557-9646 |
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