Electronic properties of Co2MnSi thin films studied by hard x-ray photoelectron spectroscopy : Heusler Compounds and Devices

Saved in:
Bibliographic Details
Published inJournal of physics. D, Applied physics Vol. 42; no. 8
Main Authors OUARDI, Siham, GLOSKOVSKII, Andrei, IKENAGA, Eiji, KE YANG, KOBAYASHI, Keisuke, KUBOTA, Takahide, OOGANE, Mikihiko, ANDO, Yasuo, BALKE, Benjamin, JENKINS, Catherine A, BARTH, Joachim, FECHER, Gerhard H, FELSER, Claudia, GORGOI, Mihaela, MERTIN, Marcel, SCHÄFERS, Franz
Format Journal Article
LanguageEnglish
Published Bristol Institute of Physics 2009
Subjects
Adsorbed layers and thin films
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron and ion emission by liquids and solids; impact phenomena
Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Exact sciences and technology
Photoemission and photoelectron spectra
Physics
Thin films and multilayers
Annealing
Localized states
Hard x radiation
Mean free path
XRD
Core levels
Thin films
Thickness
Silicon alloys
Electronic structure
Inelastic scattering
Manganese alloys
Heusler alloys
Satellite lines
Depth profiles
Cobalt alloys
X-ray photoelectron spectra
Online AccessGet full text

Cover

More Information
ISSN:0022-3727
1361-6463