Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices Organic Electronics Structural and Electronic Properties of OFETs
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| Published in | Physica status solidi. A, Applications and materials science Vol. 205; no. 3; pp. 600 - 611 |
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| Main Authors | , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Berlin
Wiley-VCH
2008
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| Subjects | |
| Online Access | Get full text |
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| Author | BURKOV, Y MANDAL, D HENKEL, K GORYACHKO, A SCHMEISSER, D MÜLLER, K PALOUMPA, I |
|---|---|
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| Keywords | Interfacial layer Charge carrier density Polymer Aluminium Mapping Electron microscopy Field effect transistor Ferroelectric materials MFIS structure Photoemission Vinylidene fluoride polymer Photoelectron spectrometry Scanning mode Surface potential Organic electronics |
| Language | English |
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| PublicationTitle | Physica status solidi. A, Applications and materials science |
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| SubjectTerms | Applied sciences Compound structure devices Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors |
| Subtitle | Organic Electronics Structural and Electronic Properties of OFETs |
| Title | Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices |
| Volume | 205 |
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