Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices Organic Electronics Structural and Electronic Properties of OFETs

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Bibliographic Details
Published inPhysica status solidi. A, Applications and materials science Vol. 205; no. 3; pp. 600 - 611
Main Authors MÜLLER, K, BURKOV, Y, MANDAL, D, HENKEL, K, PALOUMPA, I, GORYACHKO, A, SCHMEISSER, D
Format Journal Article
LanguageEnglish
Published Berlin Wiley-VCH 2008
Subjects
Applied sciences
Compound structure devices
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
Interfacial layer
Charge carrier density
Polymer
Aluminium
Mapping
Electron microscopy
Field effect transistor
Ferroelectric materials
MFIS structure
Photoemission
Vinylidene fluoride polymer
Photoelectron spectrometry
Scanning mode
Surface potential
Organic electronics
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ISSN:1862-6300