Drift compensation for automatic nanomanipulation with scanning probe microscopes : Nanoscale automation and assembly
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Published in | IEEE transactions on automation science and engineering Vol. 3; no. 3; pp. 199 - 207 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Piscataway, NJ
Institute of Electrical and Electronics Engineers
2006
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Subjects | |
Online Access | Get full text |
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ISSN: | 1545-5955 1558-3783 |
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