X-ray diffraction reciprocal lattice space mapping of α-plane AlGaN on GaN

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Bibliographic Details
Published inPhysica status solidi. B. Basic research Vol. 243; no. 7; pp. 1524 - 1528
Main Authors TSUDA, Michinobu, FURUKAWA, Hiroko, HONSHIO, Akira, IWAYA, Motoaki, KAMIYAMA, Satoshi, AMANO, Hiroshi, AKASAKI, Isamu
Format Conference Proceeding
LanguageEnglish
Published Berlin Wiley 2006
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Mechanical and acoustical properties
Physical properties of thin films, nonelectronic
Physics
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Cracks
Compressive stress
Tensile stress
Anisotropy
Gallium nitrides
Aluminium nitrides
Strained layer
Plane strain
Reciprocal lattice
XRD
Heterostructures
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ISSN:0370-1972
1521-3951