A broad-band lumped element analytic model incorporating skin effect and substrate loss for inductors and inductor like components for silicon technology performance assessment and RFIC design : Integrated Circuits Technologies for RF Circuit Applications

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Bibliographic Details
Published inIEEE transactions on electron devices Vol. 52; no. 7; pp. 1429 - 1441
Main Authors ROTELLA, Francis, BHATTACHARYA, Bijan K, RACANELLI, Marco, SINGH, Paramjit, ZAMPARDI, Pete J, BLASCHKE, Volker, MATLOUBIAN, Mishel, BROTMAN, Andy, YUHUA CHENG, DIVECHA, Rajesh, HOWARD, David, LAMPAERT, Koen, MILIOZZI, Paolo
Format Journal Article
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 2005
Subjects
Applied sciences
Design. Technologies. Operation analysis. Testing
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Integrated circuits
Magnetic devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Theoretical study. Circuits analysis and design
Performance evaluation
Circuit design
Baluns
Lumped parameter circuit
spice
Balun
Inductor
Modeling
Implementation
Optimization
Wide band
Computer aided design
Circuit simulation
circuit optimization
Differential circuit
Integrated circuit design
System design
Radiofrequency
Skin effect
Solenoid
Analytical method
Radiofrequency integrated circuits
inductors
Microassembling
Planar technology
integrated circuit modeling
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ISSN:0018-9383
1557-9646