Clustering in wavelet domain: A multi resolution ART network for anomaly detection

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Bibliographic Details
Published inAIChE journal Vol. 50; no. 10; pp. 2455 - 2466
Main Authors ARADHYE, Hrishikesh B, BAKSHI, Bhavik R, DAVIS, James F, AHALT, Stanley C
Format Journal Article
LanguageEnglish
Published Hoboken, NJ Wiley Subscription Services 2004
Subjects
Applied sciences
Chemical engineering
Exact sciences and technology
Safety
Petrochemical industry
Monte Carlo method
Utilities
Similarity
Non linear model
Failure detection
Extract
Algorithm
Modeling
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ISSN:0001-1541
1547-5905