Mid-gap states measurements of low-level boron-doped a-Si:H films
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Published in | Journal of non-crystalline solids Vol. 266-69; pp. 569 - 573 |
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Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
Amsterdam
Elsevier
2000
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Subjects | |
Online Access | Get full text |
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ISSN: | 0022-3093 1873-4812 |
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