On-chip error correcting techniques for new-generation Flash memories Flash memory technology

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Bibliographic Details
Published inProceedings of the IEEE Vol. 91; no. 4; pp. 602 - 616
Main Authors GREGORI, Stefano, CABRINI, Alessandro, KHOURI, Osama, TORELLI, Guido
Format Journal Article
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 2003
Subjects
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Integrated circuits by function (including memories and processors)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
Die
Access time
Circuit design
multilevel storage
Coding errors
reliability improvement
Review
flash memories
polyvalent codes
Coding
Flash memory
Integrated circuit
Memory capacity
Error control codes
Error correcting code
Error correction
Reliability
Multilevel system
Gain
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ISSN:0018-9219
1558-2256