Electron-difraction investigation of HgCdTe laser deposited films

• Published in: Applied surface science Vol. 154-55; pp. 206 - 210
• Main Authors: RUDYJ, I. O, KURILO, I. V, FRUGYNSKYI, M. S, KUZMA, M, ZAWISLAK, J, VIRT, I. S
• Format: Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier Science 2000
• Subjects: Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Lasers; Optics; Physics; Semiconductor lasers; laser diodes; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Inorganic compounds; Electron diffraction; Ternary compounds; Transition element compounds; Experimental study; Thin films; Semiconductor lasers; Cadmium tellurides; Morphology; Mercury tellurides; Laser ablation technique; TEM; Electronography
• ISSN: 0169-4332; 1873-5584