Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-corrected Electron Microscope with 0.5 ? Information Limit
The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development o...
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Published in | Microscopy and microanalysis Vol. 14; no. 5 |
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Main Authors | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
01.01.2008
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Subjects | |
Online Access | Get full text |
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Summary: | The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development of an ultrastable electron microscope with aberration-correcting optics and a monochromated high-brightness source has significantly improved instrument resolution and contrast. In the present work, we report information transfer beyond 50 pm and show images of single gold atoms with a signal-to-noise ratio as large as 10. The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub- ngstrom resolution. These results mark an important step toward meeting the challenge of determining the 3D atomic-scale structure of nanomaterials. |
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Bibliography: | DE-AC05-00OR22725 Work for Others (WFO) |
ISSN: | 1431-9276 1435-8115 |
DOI: | 10.1017/S1431927608080902 |