X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation
X-ray fluorescence analysis with fluorescence excitation by an electron beam with an energy of 30 kV is applied to determine the germanium, arsenic, and selenium contents in Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glassy alloys. Using calibration dependences,...
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| Published in | Semiconductors (Woodbury, N.Y.) Vol. 49; no. 10 |
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| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
United States
15.10.2015
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| Subjects | |
| Online Access | Get full text |
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| Abstract | X-ray fluorescence analysis with fluorescence excitation by an electron beam with an energy of 30 kV is applied to determine the germanium, arsenic, and selenium contents in Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glassy alloys. Using calibration dependences, the quantitative composition of the glasses is determined with an accuracy of ±0.0002 for parameters x and y in a surface layer ∼0.1 µm deep. |
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| AbstractList | X-ray fluorescence analysis with fluorescence excitation by an electron beam with an energy of 30 kV is applied to determine the germanium, arsenic, and selenium contents in Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glassy alloys. Using calibration dependences, the quantitative composition of the glasses is determined with an accuracy of ±0.0002 for parameters x and y in a surface layer ∼0.1 µm deep. |
| Author | Bobokhuzhaev, K. U. Zhilina, D. V. Terukov, E. I. Seregin, P. P. Marchenko, A. V. |
| Author_xml | – sequence: 1 fullname: Terukov, E. I. organization: Russian Academy of Sciences, Ioffe Physical–Technical Institute (Russian Federation) – sequence: 2 fullname: Seregin, P. P. email: ppseregin@mail.ru – sequence: 3 fullname: Marchenko, A. V. organization: Alexander Herzen State Pedagogical University of Russia (Russian Federation) – sequence: 4 fullname: Zhilina, D. V. organization: Russian Academy of Sciences, Ioffe Physical–Technical Institute (Russian Federation) – sequence: 5 fullname: Bobokhuzhaev, K. U. organization: Mirzo Ulug’bek National University of Uzbekistan (Uzbekistan) |
| BackLink | https://www.osti.gov/biblio/22469718$$D View this record in Osti.gov |
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| Snippet | X-ray fluorescence analysis with fluorescence excitation by an electron beam with an energy of 30 kV is applied to determine the germanium, arsenic, and... |
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| SubjectTerms | CALIBRATION CONCENTRATION RATIO ELECTRON BEAMS EXCITATION FLUORESCENCE GERMANIUM ARSENIDES GERMANIUM SELENIDES GLASS LAYERS MATERIALS SCIENCE METALLIC GLASSES SURFACES X-RAY FLUORESCENCE ANALYSIS |
| Title | X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation |
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