The effect of irradiation with electrons on the electrical parameters of Hg{sub 3}In{sub 2}Te{sub 6}

The results of studying the electrical properties of Hg{sub 3}In{sub 2}Te{sub 6} crystals irradiated with electrons with the energy E{sub e} = 18 MeV and the dose D = 4 Multiplication-Sign 10{sup 16} cm{sup -2} are reported. It is shown that, irrespective of the charge-carrier concentration in the i...

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Published inSemiconductors (Woodbury, N.Y.) Vol. 46; no. 3
Main Authors Grushka, O. G., Maslyuk, V. T., Chupyra, S. M., Mysliuk, O. M., Bilichuk, S. V., Zabolotskiy, I. I.
Format Journal Article
LanguageEnglish
Published United States 15.03.2012
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Summary:The results of studying the electrical properties of Hg{sub 3}In{sub 2}Te{sub 6} crystals irradiated with electrons with the energy E{sub e} = 18 MeV and the dose D = 4 Multiplication-Sign 10{sup 16} cm{sup -2} are reported. It is shown that, irrespective of the charge-carrier concentration in the initial material, the Hg{sub 3}In{sub 2}Te{sub 6} samples acquire the charge-carrier concentration (1.6-1.8) Multiplication-Sign 10{sup 13} cm{sup -3} after irradiation. The phenomenon of Fermi level pinning in an irradiated material is discussed. The initial charge-carrier concentration, which remains virtually unchanged after irradiation and which ensures the high radiation resistance of Hg{sub 3}In{sub 2}Te{sub 6} crystals, corresponds to a compensated material, similar to an intrinsic semiconductor at T > 260 K.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782612030128