The effect of irradiation with electrons on the electrical parameters of Hg{sub 3}In{sub 2}Te{sub 6}
The results of studying the electrical properties of Hg{sub 3}In{sub 2}Te{sub 6} crystals irradiated with electrons with the energy E{sub e} = 18 MeV and the dose D = 4 Multiplication-Sign 10{sup 16} cm{sup -2} are reported. It is shown that, irrespective of the charge-carrier concentration in the i...
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Published in | Semiconductors (Woodbury, N.Y.) Vol. 46; no. 3 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
15.03.2012
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Subjects | |
Online Access | Get full text |
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Summary: | The results of studying the electrical properties of Hg{sub 3}In{sub 2}Te{sub 6} crystals irradiated with electrons with the energy E{sub e} = 18 MeV and the dose D = 4 Multiplication-Sign 10{sup 16} cm{sup -2} are reported. It is shown that, irrespective of the charge-carrier concentration in the initial material, the Hg{sub 3}In{sub 2}Te{sub 6} samples acquire the charge-carrier concentration (1.6-1.8) Multiplication-Sign 10{sup 13} cm{sup -3} after irradiation. The phenomenon of Fermi level pinning in an irradiated material is discussed. The initial charge-carrier concentration, which remains virtually unchanged after irradiation and which ensures the high radiation resistance of Hg{sub 3}In{sub 2}Te{sub 6} crystals, corresponds to a compensated material, similar to an intrinsic semiconductor at T > 260 K. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782612030128 |