Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II
Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NS...
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Published in | Journal of synchrotron radiation Vol. 18; no. 6 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
International Union of Crystallography
16.09.2011
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Subjects | |
Online Access | Get full text |
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Summary: | Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). Here, the synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II. |
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Bibliography: | SC0012704; AC02-98CH10886 USDOE Office of Science (SC), Basic Energy Sciences (BES) BNL-221107-2021-JAAM |
ISSN: | 0909-0495 1600-5775 |