Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II

• Published in: Journal of synchrotron radiation Vol. 18; no. 6
• Main Authors: Honnicke, Marcelo G., Keister, Jeffrey W., Conley, Raymond, Kaznatcheev, Konstantine, Takacs, Peter Z., Coburn, David Scott, Reffi, Leo, Cai, Yong Q.
• Format: Journal Article
• Language: English
• Published: United States International Union of Crystallography 16.09.2011
• Subjects: Kirkpatrick Baez geometry; L-shaped mirror; MATERIALS SCIENCE; Montel optics; nested mirror; X-ray mirrors; X-ray optics
• ISSN: 0909-0495; 1600-5775

Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). Here, the synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.