A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations
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Published in | Micron (Oxford, England : 1993) Vol. 115; no. C |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
United Kingdom
Elsevier
01.12.2018
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Online Access | Get full text |
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Bibliography: | USDOE FG02-97ER45623 |
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ISSN: | 0968-4328 1878-4291 |
DOI: | 10.1016/j.micron.2018.08.007 |