Proton Solvation and Transport in Hydrated Nafion

Proton solvation properties and transport mechanisms have been studied in hydrated Nafion using the self-consistent multistate empirical valence bond (SCI-MS-EVB) method that includes the effects excess proton charge defect delocalization and Grotthuss proton hopping. It was found that sulfonate gro...

Full description

Saved in:
Bibliographic Details
Published inThe journal of physical chemistry. B Vol. 115; no. 19
Main Authors Feng, Shulu, Voth, Gregory A.
Format Journal Article
LanguageEnglish
Published United States American Chemical Society 21.04.2011
Online AccessGet full text

Cover

Loading…
More Information
Summary:Proton solvation properties and transport mechanisms have been studied in hydrated Nafion using the self-consistent multistate empirical valence bond (SCI-MS-EVB) method that includes the effects excess proton charge defect delocalization and Grotthuss proton hopping. It was found that sulfonate groups influence excess proton solvation, as well as the proton hydration structure, by stabilizing a more Zundel-like (H5O2+) structure in their first solvation shells. Hydrate proton-related hydrogen bond networks were observed to be more stable than networks with water alone. Diffusion rates, Arrhenius activation energies, and transport pathways were calculated and analyzed to characterize the nature of the proton transport. Diffusion rate analysis suggests that a proton-hopping mechanism dominates the proton transport for the studied water loading levels and that there is a clear degree of anticorrelation with the vehicular transport. The activation energy drops quickly with an increasing water content when the water loading level is smaller than ~10 H2O/SO3–, which is consistent with experimental observations. The sulfonate groups were also found to affect the proton hopping directions. The temperature and water content effects on the proton transport pathways were also investigated.
Bibliography:USDOE Office of Science (SC), Basic Energy Sciences (BES)
SC0005418
ISSN:1520-6106
1520-5207