Electrical characteristics of homoepitaxial p-GaSb analyzed by the pen junction: A correction on the Hall parameter of heteroepitaxial p-GaSb/SIeGaAs

Electrical characteristics of p-GaSb are examined by applying the junction Hall effect measurement (JHEM) to homoepitaxially grown p-GaSb/n-GaSb layers, and analysis is made on the disagreement with those of an equivalent heteroepitial p-GaSb/semi-insulating (SI) GaAs. The photoluminescence spectra...

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Bibliographic Details
Published inCurrent applied physics pp. 1624 - 1627
Main Authors 김준오, 노삼규
Format Journal Article
LanguageEnglish
Published 한국물리학회 01.11.2012
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ISSN1567-1739
1878-1675

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Summary:Electrical characteristics of p-GaSb are examined by applying the junction Hall effect measurement (JHEM) to homoepitaxially grown p-GaSb/n-GaSb layers, and analysis is made on the disagreement with those of an equivalent heteroepitial p-GaSb/semi-insulating (SI) GaAs. The photoluminescence spectra reveal that a large number of intrinsic defects are induced due to the lattice mismatch in p-GaSb/SI eGaAs, and the shallow donors of [SbGa] involved in the electrical conduction was significantly reduced in p-GaSb/n-GaSb. This proves that the homoepitaxial p-GaSb is quite different from the heteroepitaxial one in the electrical and the optical characteristics, and that the JHEM approach is correct in determining the Hall parameters of the epitaxial layers whose high-resistive substrates are not available. KCI Citation Count: 1
Bibliography:G704-001115.2012.12.6.027
ISSN:1567-1739
1878-1675