Calculated and measured silicon p-i-n limiter short-pulse damage thresholds
Limiters used to protect sensitive electronics from high-level RF radiation are themselves subject to damage. A combined theoretical and experimental study has been made of damage thresholds of silicon PIN limiters with intrinsic region widths of 0.5 to 10 mu m, using 1.5-9.4-GHz frequencies, and pu...
Saved in:
| Published in | IEEE International Digest on Microwave Symposium pp. 761 - 764 vol.2 |
|---|---|
| Main Authors | , , |
| Format | Conference Proceeding |
| Language | English |
| Published |
IEEE
1990
|
| Subjects | |
| Online Access | Get full text |
| DOI | 10.1109/MWSYM.1990.99690 |
Cover
| Abstract | Limiters used to protect sensitive electronics from high-level RF radiation are themselves subject to damage. A combined theoretical and experimental study has been made of damage thresholds of silicon PIN limiters with intrinsic region widths of 0.5 to 10 mu m, using 1.5-9.4-GHz frequencies, and pulse lengths from 10 to 1000 ns. This work is also useful in designing dual-diode limiters to reduce spike leakage and to increase the damage threshold.< > |
|---|---|
| AbstractList | Limiters used to protect sensitive electronics from high-level RF radiation are themselves subject to damage. A combined theoretical and experimental study has been made of damage thresholds of silicon PIN limiters with intrinsic region widths of 0.5 to 10 mu m, using 1.5-9.4-GHz frequencies, and pulse lengths from 10 to 1000 ns. This work is also useful in designing dual-diode limiters to reduce spike leakage and to increase the damage threshold.< > |
| Author | Ward, A.L. Tan, R.J. Kaul, R. |
| Author_xml | – sequence: 1 givenname: A.L. surname: Ward fullname: Ward, A.L. organization: Harry Diamond Lab., Adelphi, MD, USA – sequence: 2 givenname: R.J. surname: Tan fullname: Tan, R.J. organization: Harry Diamond Lab., Adelphi, MD, USA – sequence: 3 givenname: R. surname: Kaul fullname: Kaul, R. organization: Harry Diamond Lab., Adelphi, MD, USA |
| BookMark | eNp9jb0KwjAURjPo4N-u232B1ARByFwUQTopiFO5NLf2QpKWJB18e4s4O32cc4ZvKWahDyTEVqtCa2X21eP2rAptjCqMORq1ENcSXTM6zGQBgwVPmMY4QWLHTR9gkCwDOPacKULq-pjlMLpEYNHjiyB3kSbtbFqLeYtT2fx2JXbn0728SCaieojsMb7r7_HhX_sAy-w4pA |
| ContentType | Conference Proceeding |
| DBID | 6IE 6IL CBEJK RIE RIL |
| DOI | 10.1109/MWSYM.1990.99690 |
| DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings Accès UT - IEEE Xplore POP ALL IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP All) 1998-Present |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| EndPage | 764 vol.2 |
| ExternalDocumentID | 99690 |
| Genre | orig-research |
| GroupedDBID | 6IE 6IL CBEJK RIE RIL |
| ID | FETCH-ieee_primary_996903 |
| IEDL.DBID | RIE |
| IngestDate | Thu Jun 29 18:11:49 EDT 2023 |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-ieee_primary_996903 |
| ParticipantIDs | ieee_primary_99690 |
| PublicationCentury | 1900 |
| PublicationDate | 19900000 |
| PublicationDateYYYYMMDD | 1990-01-01 |
| PublicationDate_xml | – year: 1990 text: 19900000 |
| PublicationDecade | 1990 |
| PublicationTitle | IEEE International Digest on Microwave Symposium |
| PublicationTitleAbbrev | MWSYM |
| PublicationYear | 1990 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| Score | 2.407703 |
| Snippet | Limiters used to protect sensitive electronics from high-level RF radiation are themselves subject to damage. A combined theoretical and experimental study has... |
| SourceID | ieee |
| SourceType | Publisher |
| StartPage | 761 |
| SubjectTerms | Frequency Heating Laboratories P-i-n diodes PIN photodiodes Protection Pulse measurements Silicon Space vector pulse width modulation Voltage |
| Title | Calculated and measured silicon p-i-n limiter short-pulse damage thresholds |
| URI | https://ieeexplore.ieee.org/document/99690 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEB60J09arFhf5OA127TZrZtzsRRlRVCxnko2yWJxmy7d3Yu_3kniAx8HbyEkMGRCZjIz3zcA51In8bCQmsZcceoShlSMxpyKVF4YxVOmffeG7GY8e4iv5sn8nSbHY2GMMb74zERu6HP5eq1aFyoboG8u8Hu-jZcsILU-8o5MDLLHu6fMYe9Y5Jd965bijcV0N3Qdqj3HoKsReYnaJo_U6w8Gxv_JsQe9L1Aeuf00N13YMnYfrieydJWk6DcSaTVZhZCfJvWyRB1bUtEltaT0MKYNqZ_R26ZVi_aQaLnCt4Q0qMza5aDqHvSnl_eTGXWiLKpAQ7HwUvAD6Ni1NYdA-EhqrpI8FTGLc4naKZSjxxNCF4kasj50f-8_-mvyGHbcQYZIwwl0mk1rTtH2NvmZP_Y39ruNPw |
| linkProvider | IEEE |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwED6hMsAEFUWUpwdWp2ntlHiuqAJtKiSKKFPk2I6oSN2oSRZ-PbbDQzwGtsiKpZNP8ne-u-87gEsuA9rPuMSUCIJtwRCzwZBgFvIrJUjoSze9IZ4Nowd6uwgW7zI5jgujlHLNZ8qzn66WL9eitqmynonNmXmebxvUp0HD1fqoPPqsFz_eP8WWfed77sdv81IcXIz3mrlDpVMZtF0iL15dpZ54_aHB-D9L9qHzRctDd5-A04YtpQ9gMuK57SU1kSPiWqJVk_STqFzmxssaFXiJNcodkWmDymcTb-OiNoiIJF-Z2wRVxp2lrUKVHeiOr-ejCFtTkqIRokicFeQQWnqt1REgMuCSiCANGfVpyo1_MmEF8hiTWSD6fhfav_cf_7V4ATvRPJ4m05vZ5AR27aE2eYdTaFWbWp0ZJK7Sc-eCN4cBkIw |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=IEEE+International+Digest+on+Microwave+Symposium&rft.atitle=Calculated+and+measured+silicon+p-i-n+limiter+short-pulse+damage+thresholds&rft.au=Ward%2C+A.L.&rft.au=Tan%2C+R.J.&rft.au=Kaul%2C+R.&rft.date=1990-01-01&rft.pub=IEEE&rft.spage=761&rft.epage=764+vol.2&rft_id=info:doi/10.1109%2FMWSYM.1990.99690&rft.externalDocID=99690 |