Novel ESD Compact Modeling Methodology Using Machine Learning Techniques

Novel ESD compact modeling methodology using machine learning techniques is proposed for the first time in this paper. Comparisons between conventional, novel fitting methodology and different machine learning models are discussed. The advantages of this novel methodology are introduced and methods...

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Published in2020 42nd Annual EOS/ESD Symposium (EOS/ESD) pp. 1 - 7
Main Authors Liang, Wei, Yang, Xuejiao, Loiseau, Alain, Mitra, Souvick, Gauthier, Robert
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association 13.09.2020
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Abstract Novel ESD compact modeling methodology using machine learning techniques is proposed for the first time in this paper. Comparisons between conventional, novel fitting methodology and different machine learning models are discussed. The advantages of this novel methodology are introduced and methods to further improve the model accuracy are also discussed.
AbstractList Novel ESD compact modeling methodology using machine learning techniques is proposed for the first time in this paper. Comparisons between conventional, novel fitting methodology and different machine learning models are discussed. The advantages of this novel methodology are introduced and methods to further improve the model accuracy are also discussed.
Author Yang, Xuejiao
Mitra, Souvick
Liang, Wei
Loiseau, Alain
Gauthier, Robert
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  givenname: Robert
  surname: Gauthier
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  organization: GlobalFoundries,Essex Junction,VT,USA,05452
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Snippet Novel ESD compact modeling methodology using machine learning techniques is proposed for the first time in this paper. Comparisons between conventional, novel...
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