Novel ESD Compact Modeling Methodology Using Machine Learning Techniques

Novel ESD compact modeling methodology using machine learning techniques is proposed for the first time in this paper. Comparisons between conventional, novel fitting methodology and different machine learning models are discussed. The advantages of this novel methodology are introduced and methods...

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Bibliographic Details
Published in2020 42nd Annual EOS/ESD Symposium (EOS/ESD) pp. 1 - 7
Main Authors Liang, Wei, Yang, Xuejiao, Loiseau, Alain, Mitra, Souvick, Gauthier, Robert
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association 13.09.2020
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Summary:Novel ESD compact modeling methodology using machine learning techniques is proposed for the first time in this paper. Comparisons between conventional, novel fitting methodology and different machine learning models are discussed. The advantages of this novel methodology are introduced and methods to further improve the model accuracy are also discussed.