Experimental Quantum Process Tomography of Controlled-phase Gate for Time-bin Qubits

We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process matrix using quantum process tomography with 16 distinct inputs from which we determined a process fidelity of 82%.

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Published in2019 IEEE Photonics Society Summer Topical Meeting Series (SUM) pp. 1 - 2
Main Authors Lo, Hsin-Pin, Ikuta, Takuya, Matsuda, Nobuyuki, Honjo, Toshimori, Munro, William J., Takesue, Hiroki
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2019
Subjects
Logic gates
Optical switches
Photonics
Qubit
Tomography
Transmission line matrix methods
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Abstract We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process matrix using quantum process tomography with 16 distinct inputs from which we determined a process fidelity of 82%.
AbstractList We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process matrix using quantum process tomography with 16 distinct inputs from which we determined a process fidelity of 82%.
Author Ikuta, Takuya
Munro, William J.
Honjo, Toshimori
Matsuda, Nobuyuki
Takesue, Hiroki
Lo, Hsin-Pin
Author_xml – sequence: 1
  givenname: Hsin-Pin
  surname: Lo
  fullname: Lo, Hsin-Pin
  email: hsinpin.lo@lab.ntt.co.jp
  organization: NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
– sequence: 2
  givenname: Takuya
  surname: Ikuta
  fullname: Ikuta, Takuya
  email: takesue.hiroki@lab.ntt.co.jp
  organization: NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
– sequence: 3
  givenname: Nobuyuki
  surname: Matsuda
  fullname: Matsuda, Nobuyuki
  organization: NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
– sequence: 4
  givenname: Toshimori
  surname: Honjo
  fullname: Honjo, Toshimori
  organization: NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
– sequence: 5
  givenname: William J.
  surname: Munro
  fullname: Munro, William J.
  organization: NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
– sequence: 6
  givenname: Hiroki
  surname: Takesue
  fullname: Takesue, Hiroki
  organization: NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
BookMark eNp9jrsOwiAYRn-NJl6fwIUXaIW2FpiNl02N7IbqX61poQFM9O3t4Ox0hi8535nAwFiDAAtGY8aoXB73h_NZxQllMhZcZiLPejCXXDCeCEZXktM-jJOU55HIWTaCifdPSikTIh-D2rxbdFWDJuianF7ahFdDjs5e0XuibGPvTrePD7ElWVsTnK1rvEXtQ3skOx2QlNYR1QmiojKdoKiCn8Gw1LXH-Y9TWGw3ar2PKkS8tN2ddp_LLzb9v34BIqpE1A
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/PHOSST.2019.8794864
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Applied Sciences
EISBN 9781728105970
1728105978
EISSN 2376-8614
EndPage 2
ExternalDocumentID 8794864
Genre orig-research
GroupedDBID 29G
6IE
6IF
6IK
6IL
AAJGR
ADZIZ
AFFNX
AI.
ALMA_UNASSIGNED_HOLDINGS
CBEJK
CHZPO
IPLJI
M43
OCL
RIE
RIL
RNS
VH1
ID FETCH-ieee_primary_87948643
IEDL.DBID RIE
IngestDate Wed Jun 26 19:28:53 EDT 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-ieee_primary_87948643
ParticipantIDs ieee_primary_8794864
PublicationCentury 2000
PublicationDate 2019-July
PublicationDateYYYYMMDD 2019-07-01
PublicationDate_xml – month: 07
  year: 2019
  text: 2019-July
PublicationDecade 2010
PublicationTitle 2019 IEEE Photonics Society Summer Topical Meeting Series (SUM)
PublicationTitleAbbrev PHOSST
PublicationYear 2019
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001886
Score 4.250285
Snippet We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Logic gates
Optical switches
Photonics
Qubit
Tomography
Transmission line matrix methods
Title Experimental Quantum Process Tomography of Controlled-phase Gate for Time-bin Qubits
URI https://ieeexplore.ieee.org/document/8794864
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PT8IwFH4BTnpBAaOipgePbjDXtd2ZQBYTFMNMuBHaddEoG4Ht4l9vu9aJhoO3pklfX_rr9cf3fQW4JUOWYiqw46U0cLCXrJwwFerUqmmP0meCEs13nj6S6AU_LIJFA-5qLoyUsgKfSVcnq7f8JBelviobMDV4GMFNaNIwNFytetX1GCNWVcgbhoNZ9DSfxxq6pcaCKfbr_5QqfEzaMP2u2KBG3t2y4K74_KPJ-F_PTqD3Q9RDszoEnUJDZh1o250lsvN214HjPdnBLsTjPVl_9Fyqxi3XyFIGUJyvrYw1ylM0MlD2D5k4m1cV8ZC-bkNqp4s0eUSfq5UB_lbsetCfjONR5Gi3lxsjYrG0Hvtn0MryTJ5r9jaj9z4mJPW5mtYJXyVqOQw4p0JQGbAL6B6ycHk4uw9HuvENsvUKWsW2lNcqfhf8puq4L59ioJY
link.rule.ids 310,311,783,787,792,793,799,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PT8IwFH5BPKgXFDAq_ujBoxvMdV05E8hUhhhmwm2hXReNshHZLv71tludaDh4a5q0femv99p-31eAa9KjMXY5NqzYdQxsRQujH3N5alW0R2FT7hLFd_YnxHvG93NnXoObigsjhCjAZ8JUyeItP0p5rq7KulROHkrwDuzKuJqSkq1V7bsWpUTrClm9fnfqPc5mgQJvydlQFvz1g0rhQEYN8L-bLnEjb2aeMZN__lFl_K9th9D-oeqhaeWEjqAmkiY0dGyJ9MpdN-FgQ3iwBcFwQ9gfPeWye_Ml0qQBFKRLLWSN0hgNSjD7u4iM1Yv0eUhduCEZ6yJFH1Ena1kBe83WbeiMhsHAM5TZ4aqUsQi1xfYx1JM0ESeKv03dWxsTEttMLuyILSK5ITqMuZy7wqGn0NpWw9n27CvY8wJ_HI7vJg8d2FcDUeJcz6GefeTiQnrzjF0Wg_gFLr-j4Q
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2019+IEEE+Photonics+Society+Summer+Topical+Meeting+Series+%28SUM%29&rft.atitle=Experimental+Quantum+Process+Tomography+of+Controlled-phase+Gate+for+Time-bin+Qubits&rft.au=Lo%2C+Hsin-Pin&rft.au=Ikuta%2C+Takuya&rft.au=Matsuda%2C+Nobuyuki&rft.au=Honjo%2C+Toshimori&rft.date=2019-07-01&rft.pub=IEEE&rft.eissn=2376-8614&rft.spage=1&rft.epage=2&rft_id=info:doi/10.1109%2FPHOSST.2019.8794864&rft.externalDocID=8794864