Experimental Quantum Process Tomography of Controlled-phase Gate for Time-bin Qubits

We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process matrix using quantum process tomography with 16 distinct inputs from which we determined a process fidelity of 82%.

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Bibliographic Details
Published in2019 IEEE Photonics Society Summer Topical Meeting Series (SUM) pp. 1 - 2
Main Authors Lo, Hsin-Pin, Ikuta, Takuya, Matsuda, Nobuyuki, Honjo, Toshimori, Munro, William J., Takesue, Hiroki
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2019
Subjects
Logic gates
Optical switches
Photonics
Qubit
Tomography
Transmission line matrix methods
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Summary:We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process matrix using quantum process tomography with 16 distinct inputs from which we determined a process fidelity of 82%.
ISSN:2376-8614
DOI:10.1109/PHOSST.2019.8794864