Mathematical modelling and measurement of etching profile for junction shape in MR read heads
A mathematical model was generated to predict the junction profile between MR element and hard bias element. Etching rates as a function of incident beam angle for relevant materials were experimentally determined for this model.
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Published in | IEEE International Magnetics Conference p. DB04 |
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Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1999
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Subjects | |
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Abstract | A mathematical model was generated to predict the junction profile between MR element and hard bias element. Etching rates as a function of incident beam angle for relevant materials were experimentally determined for this model. |
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AbstractList | A mathematical model was generated to predict the junction profile between MR element and hard bias element. Etching rates as a function of incident beam angle for relevant materials were experimentally determined for this model. |
Author | Young K. Kim Min, K.-I. Shong, E.Y. Won-Je Jeong Hahm, H.J. |
Author_xml | – sequence: 1 surname: Won-Je Jeong fullname: Won-Je Jeong organization: Samsung Electro-Merhanics – sequence: 2 givenname: E.Y. surname: Shong fullname: Shong, E.Y. – sequence: 3 givenname: H.J. surname: Hahm fullname: Hahm, H.J. – sequence: 4 givenname: K.-I. surname: Min fullname: Min, K.-I. – sequence: 5 surname: Young K. Kim fullname: Young K. Kim |
BookMark | eNp9jjkOwjAQRS0BEusFqOYCBFshgEuE2IpQIFqERsmEGHmJbFNwe0BQ84r3i9f8PmtbZ4mxseCJEFxOD8dzvtolQkqZLNNFKrMW6_PFkqfZhy4bhXDnb2ZZJsS8xy45xpoMRlWgBuNK0lrZG6AtwRCGhydDNoKrgGJRf1LjXaU0QeU83B-2iMpZCDU2BMpCfgJPWEL9VhiyToU60Oi3Azbebs7r_UQR0bXxyqB_Xr9H07_xBQoCRUY |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/INTMAG.1999.837395 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
EndPage | DB04 |
ExternalDocumentID | 837395 |
Genre | orig-research |
GroupedDBID | 6IE 6IH 6IK 6IL AAJGR ACGHX ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK OCL RIE RIL RIO |
ID | FETCH-ieee_primary_8373953 |
IEDL.DBID | RIE |
ISBN | 0780355555 9780780355552 |
IngestDate | Wed Jun 26 19:25:59 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-ieee_primary_8373953 |
ParticipantIDs | ieee_primary_837395 |
PublicationCentury | 1900 |
PublicationDate | 19990000 |
PublicationDateYYYYMMDD | 1999-01-01 |
PublicationDate_xml | – year: 1999 text: 19990000 |
PublicationDecade | 1990 |
PublicationTitle | IEEE International Magnetics Conference |
PublicationTitleAbbrev | INTMAG |
PublicationYear | 1999 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0000455116 |
Score | 2.5728405 |
Snippet | A mathematical model was generated to predict the junction profile between MR element and hard bias element. Etching rates as a function of incident beam angle... |
SourceID | ieee |
SourceType | Publisher |
StartPage | DB04 |
SubjectTerms | Etching Mathematical model Shape measurement |
Title | Mathematical modelling and measurement of etching profile for junction shape in MR read heads |
URI | https://ieeexplore.ieee.org/document/837395 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB5sT558VbQ-mIPXpEnTvI4i1iqkiFToRcommcVnUprk4q93dpOmKD2YU7ILy8As-81M9vsG4CqVCQNpYBlCup4xikkYMbkB7-WhIAp9GWudgmjqTZ5HD3N33uhsay4MEenLZ2SqV_0vP82TSpXKBpxMOaHbgY4fhjVVqy2ncGTCoYOnE_PAYhDlp9HXWX8P15wZKxzcT2fR9Z2i6vFW0av-6q6iwWW8V7O2C61JqO6UfJhVGZvJ9x_Fxn_avQ-9DYsPH1t8OoAdyo7gJWp1WsUn6j44ipCOIkvxa1MvxFyicqiaatp6I4e3-M4wqFyJxatYEr5lGD0hx50p8qGeFj3oj29nNxNDWbdY1koWi9ow5xi6WZ7RCSAnF2TbJDmLULKFSeBI6dqU2Joh6_mncLhlgf7W0TPYrTUOVL3iHLrlqqILRvAyvtS--wHnq51A |
link.rule.ids | 310,311,783,787,792,793,799,4057,4058,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT4NAEJ5oPejJV43W1xy80kIpFI7GWKmWxhhMejGEx2ysD9pIufjrnV0ojaYHOcFusplkNvvNDPt9A3CVioSB1NG1SFi21osp0mKyHN7L3YjI7YtY6RT4Y9t77t1PrEmls624MESkLp9RW76qf_npLClkqazDyZTpWpuwxWG1Y5dkrbqgwrEJBw-2Ss0dnWGUn0phZ_ndXbJmdLczHAf-9Z0k6_FmUev-6q-i4GWwW_K2c6VKKG-VvLeLRdxOvv9oNv7T8j1ornh8-Fgj1D5sUHYIL36t1Bp9oOqEIynpGGUpfq4qhjgTKF0qp6rG3sgBLr4xEEpnYv4azQmnGfpPyJFninysp3kTWoPb4MbTpHXhvNSyCEvDzCNoZLOMjgE5vSDDIMF5hBQuTBxTCMugxFAcWbt_AgdrFmitHb2EbS_wR-FoOH44hZ1S8UBWL86gsfgq6JzxfBFfKD_-AFERoIs |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=IEEE+International+Magnetics+Conference&rft.atitle=Mathematical+modelling+and+measurement+of+etching+profile+for+junction+shape+in+MR+read+heads&rft.au=Won-Je+Jeong&rft.au=Shong%2C+E.Y.&rft.au=Hahm%2C+H.J.&rft.au=Min%2C+K.-I.&rft.date=1999-01-01&rft.pub=IEEE&rft.isbn=9780780355552&rft.spage=DB04&rft.epage=DB04&rft_id=info:doi/10.1109%2FINTMAG.1999.837395&rft.externalDocID=837395 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780355552/lc.gif&client=summon&freeimage=true |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780355552/mc.gif&client=summon&freeimage=true |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780355552/sc.gif&client=summon&freeimage=true |