Mainstream ATE: to reduce LSI and VLSI test cost

It is proposed that test costs for LSI and VLSI mainstream devices be reduced by matching performance requirements with manufacturing strategy. The approach is to complement ATE (automatic test equipment) for testing leading-edge devices by ATE with the appropriate requirements for testing families...

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Bibliographic Details
Published inProceedings. 'Meeting the Tests of Time'., International Test Conference pp. 591 - 596
Main Authors Salter, M.W., Taschioglou, K.
Format Conference Proceeding
LanguageEnglish
Published IEEE Comput. Soc. Press 1989
Subjects
Costs
Economies of scale
Large scale integration
Lead compounds
Marine vehicles
Production
Semiconductor device manufacture
Sociotechnical systems
System testing
Very large scale integration
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Summary:It is proposed that test costs for LSI and VLSI mainstream devices be reduced by matching performance requirements with manufacturing strategy. The approach is to complement ATE (automatic test equipment) for testing leading-edge devices by ATE with the appropriate requirements for testing families of mainstream devices.< >
DOI:10.1109/TEST.1989.82345