Some methods for profile measurement and an application for on-machine measurement
In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy improvement, four kinds of profile measurement methods (conventional reversal method, improved reversal method, displacement method, improved displac...
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Published in | IEEE SMC'99 Conference Proceedings. 1999 IEEE International Conference on Systems, Man, and Cybernetics (Cat. No.99CH37028) Vol. 4; pp. 481 - 485 vol.4 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1999
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Abstract | In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy improvement, four kinds of profile measurement methods (conventional reversal method, improved reversal method, displacement method, improved displacement method) are discussed through theoretical analyses and the profile measurement experiments in this paper, and the improved displacement method has been applied to on-machine measurement. |
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AbstractList | In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy improvement, four kinds of profile measurement methods (conventional reversal method, improved reversal method, displacement method, improved displacement method) are discussed through theoretical analyses and the profile measurement experiments in this paper, and the improved displacement method has been applied to on-machine measurement. |
Author | Obi, M. Shimizu, T. Xiaoyong Ai |
Author_xml | – sequence: 1 surname: Xiaoyong Ai fullname: Xiaoyong Ai organization: Graduate Sch. of Eng., Yamanashi Univ., Kofu, Japan – sequence: 2 givenname: T. surname: Shimizu fullname: Shimizu, T. – sequence: 3 givenname: M. surname: Obi fullname: Obi, M. |
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PublicationTitle | IEEE SMC'99 Conference Proceedings. 1999 IEEE International Conference on Systems, Man, and Cybernetics (Cat. No.99CH37028) |
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Snippet | In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy... |
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SubjectTerms | Artificial intelligence Displacement measurement Distortion measurement Electronic mail Instruments Machine tools Mechanical systems Mechanical variables measurement Position measurement Systems engineering and theory |
Title | Some methods for profile measurement and an application for on-machine measurement |
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