Some methods for profile measurement and an application for on-machine measurement

In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy improvement, four kinds of profile measurement methods (conventional reversal method, improved reversal method, displacement method, improved displac...

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Published inIEEE SMC'99 Conference Proceedings. 1999 IEEE International Conference on Systems, Man, and Cybernetics (Cat. No.99CH37028) Vol. 4; pp. 481 - 485 vol.4
Main Authors Xiaoyong Ai, Shimizu, T., Obi, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1999
Subjects
Artificial intelligence
Displacement measurement
Distortion measurement
Electronic mail
Instruments
Machine tools
Mechanical systems
Mechanical variables measurement
Position measurement
Systems engineering and theory
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Summary:In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy improvement, four kinds of profile measurement methods (conventional reversal method, improved reversal method, displacement method, improved displacement method) are discussed through theoretical analyses and the profile measurement experiments in this paper, and the improved displacement method has been applied to on-machine measurement.
ISBN:9780780357310
0780357310
ISSN:1062-922X
2577-1655
DOI:10.1109/ICSMC.1999.812451