A comparison of monolithic background calibration in two time-interleaved analog-to-digital converters

Two background calibration methods for time-interleaved pipelined analog-to-digital converters are described and compared. One approach uses an extra ADC channel and analog calibration circuits; the other uses extra resolution and digital calibration circuits. Both approaches have been integrated in...

Full description

Saved in:
Bibliographic Details
Published in1998 IEEE International Symposium on Circuits and Systems (ISCAS) Vol. 1; pp. 13 - 16 vol.1
Main Authors Dyer, K., Daihong Fu, Hurst, P., Lewis, S.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1998
Subjects
Analog-digital conversion
Apertures
Bandwidth
Calibration
Digital filters
Digital signal processing
Filtering
Laboratories
Signal resolution
Solid state circuits
Online AccessGet full text

Cover

More Information
Summary:Two background calibration methods for time-interleaved pipelined analog-to-digital converters are described and compared. One approach uses an extra ADC channel and analog calibration circuits; the other uses extra resolution and digital calibration circuits. Both approaches have been integrated in a 1-/spl mu/m CMOS process. The strengths and weaknesses of the two approaches are presented, and the measured data are compared.
ISBN:9780780344556
0780344553
DOI:10.1109/ISCAS.1998.704123