Scheduling Semiconductor Manufacturing Plants to Reduce Mean and Variance of Cycle-Time

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Bibliographic Details
Published inProceedings. IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop pp. 83 - 85
Main Authors Lu, S.C.H., Ramaswamy, D., Kumar, P.R.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1993
Subjects
Fabrication
Fluctuations
Job shop scheduling
Manufacturing systems
Semiconductor device manufacture
Semiconductor device testing
Smoothing methods
System testing
Traffic control
Virtual manufacturing
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DOI:10.1109/ASMC.1993.682485